Aneesha P. Deo
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2000
1
EE
Kamran Zarrineh
,
R. Dean Adams
, Aneesha P. Deo: Defect Analysis and Realistic Fault Model Extensions for Static Random Access Memories.
MTDT 2000
: 119-124
Coauthor
Index
1
R. Dean Adams
[
1
]
2
Kamran Zarrineh
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
