| |
| 1996 | ||
|---|---|---|
| 3 | Michael G. Davis: The Effect of Periof Generation Techniques on Period Resolution and Waveform Jitter in VLSI Test Systems. ITC 1996: 685-690 | |
| 1995 | ||
| 2 | Michael G. Davis: Evaluating Waveform-Generation Capabilities of VLSI Test Systems. ITC 1995: 469-478 | |
| 1994 | ||
| 1 | Michael G. Davis: Implementation of a Dual-Segment Architecture for a High-Pin-Count VLSI Test System. ITC 1994: 267-272 | |