S. Rahal

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1990

1 EE Rene David, S. Rahal, J. L. Rainard: Some relationships between delay testing and stuck-open testing in CMOS circuits. EURO-DAC 1990: 339-343

1990
1	EE	Rene David, S. Rahal, J. L. Rainard: Some relationships between delay testing and stuck-open testing in CMOS circuits. EURO-DAC 1990: 339-343

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