| |
| 1997 | ||
|---|---|---|
| 5 | EE | V. Prepin, R. David: Fault coverage of a long random test sequence estimated from a short simulation. VTS 1997: 391-398 |
| 4 | EE | R. David, Janusz A. Brzozowski, Helmut Jürgensen: Testing for Bounded Faults in RAMs. J. Electronic Testing 10(3): 197-214 (1997) |
| 1990 | ||
| 3 | R. David: Some Results on Higher Suslin Trees. J. Symb. Log. 55(2): 526-536 (1990) | |
| 1984 | ||
| 2 | Yves Dallery, R. David: Some New Results on Operational Analysis. Performance 1984: 119-134 | |
| 1979 | ||
| 1 | R. David, R. Tellez-Giron: Comments on ``The Error Latency of a Fault in a Sequential Digital Circuit''. IEEE Trans. Computers 28(1): 85-86 (1979) | |
| 1 | Janusz A. Brzozowski | [4] |
| 2 | Yves Dallery | [2] |
| 3 | Helmut Jürgensen | [4] |
| 4 | V. Prepin | [5] |
| 5 | R. Tellez-Giron | [1] |