V. Prepin
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1997
1
EE
V. Prepin,
R. David
: Fault coverage of a long random test sequence estimated from a short simulation.
VTS 1997
: 391-398
Coauthor
Index
1
R. David
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
