2008 |
4 | EE | Janakiraman Viraraghavan,
Bishnu Prasad Das,
Bharadwaj Amrutur:
Voltage and Temperature Scalable Standard Cell Leakage Models Based on Stacks for Statistical Leakage Characterization.
VLSI Design 2008: 667-672 |
3 | EE | Bishnu Prasad Das,
Janakiraman V. Bharadwaj Amrutur,
H. S. Jamadagni,
N. V. Arvind:
Voltage and Temperature Scalable Gate Delay and Slew Models Including Intra-Gate Variations.
VLSI Design 2008: 685-691 |
2007 |
2 | EE | Bishnu Prasad Das,
Anne-Françoise Cutting-Decelle,
Robert I. M. Young,
Keith Case,
Shahin Rahimifard,
Chimay J. Anumba,
N. M. Bouchlaghem:
Towards the understanding of the requirements of a communication language to support process interoperation in cross-disciplinary supply chains.
Int. J. Computer Integrated Manufacturing 20(4): 396-410 (2007) |
2006 |
1 | EE | Anne-Françoise Cutting-Decelle,
Bishnu Prasad Das,
Robert I. M. Young,
Keith Case,
Shahin Rahimifard,
Chimay J. Anumba,
N. M. Bouchlaghem:
Building supply chain communication systems: a review of methods and techniques.
Data Science Journal 5: 29-51 (2006) |