| |
| 2008 | ||
|---|---|---|
| 1 | EE | Janakiraman Viraraghavan, Bishnu Prasad Das, Bharadwaj Amrutur: Voltage and Temperature Scalable Standard Cell Leakage Models Based on Stacks for Statistical Leakage Characterization. VLSI Design 2008: 667-672 |
| 1 | Bharadwaj Amrutur | [1] |
| 2 | Bishnu Prasad Das | [1] |