F. Cristiano

2001
2	EE	A. C. Lamb, J. F. W. Schiz, J. M. Bonar, F. Cristiano, P. Ashburn, S. Hall, P. L. F. Hemment: Characterisation of emitter/base leakage currents in SiGe HBTs produced using selective epitaxy. Microelectronics Reliability 41(2): 273-279 (2001)
1	EE	L. Jalabert, Pierre Temple-Boyer, G. Sarrabayrouse, F. Cristiano, B. Colombeau, F. Voillot, C. Armand: Reduction of boron penetration through thin silicon oxide with a nitrogen doped silicon layer. Microelectronics Reliability 41(7): 981-985 (2001)

Coauthor Index

1	C. Armand	[1]
2	P. Ashburn	[2]
3	J. M. Bonar	[2]
4	B. Colombeau	[1]
5	S. Hall	[2]
6	P. L. F. Hemment	[2]
7	L. Jalabert	[1]
8	A. C. Lamb	[2]
9	G. Sarrabayrouse	[1]
10	J. F. W. Schiz	[2]
11	Pierre Temple-Boyer	[1]
12	F. Voillot	[1]

Colors in the list of coauthors