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Didier Cottet

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2002
3EEDidier Cottet, Michael Scheffler, Gerhard Tröster: A novel, zone based process monitoring method for low cost MCM-D substrates manufactured on large area panels. Microelectronics Reliability 42(3): 417-426 (2002)
2001
2EEMichael Scheffler, Didier Cottet, Gerhard Tröster: A simplified yield modeling method for design rule trade-off in interconnection substrates. Microelectronics Reliability 41(6): 861-869 (2001)
2000
1EERolf Enzler, Tobias Jeger, Didier Cottet, Gerhard Tröster: High-Level Area and Performance Estimation of Hardware Building Blocks on FPGAs. FPL 2000: 525-534

Coauthor Index

1Rolf Enzler [1]
2Tobias Jeger [1]
3Michael Scheffler [2] [3]
4Gerhard Tröster [1] [2] [3]

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