| |
| 2002 | ||
|---|---|---|
| 3 | EE | Didier Cottet, Michael Scheffler, Gerhard Tröster: A novel, zone based process monitoring method for low cost MCM-D substrates manufactured on large area panels. Microelectronics Reliability 42(3): 417-426 (2002) |
| 2001 | ||
| 2 | EE | Michael Scheffler, Didier Cottet, Gerhard Tröster: A simplified yield modeling method for design rule trade-off in interconnection substrates. Microelectronics Reliability 41(6): 861-869 (2001) |
| 2000 | ||
| 1 | EE | Rolf Enzler, Tobias Jeger, Didier Cottet, Gerhard Tröster: High-Level Area and Performance Estimation of Hardware Building Blocks on FPGAs. FPL 2000: 525-534 |
| 1 | Rolf Enzler | [1] |
| 2 | Tobias Jeger | [1] |
| 3 | Michael Scheffler | [2] [3] |
| 4 | Gerhard Tröster | [1] [2] [3] |