| |
| 2005 | ||
|---|---|---|
| 4 | EE | James Chin, Mehrdad Nourani: FITS: An Integrated ILP-Based Test Scheduling Environment. IEEE Trans. Computers 54(12): 1598-1613 (2005) |
| 2004 | ||
| 3 | EE | James Chin, Mehrdad Nourani: SoC Test Scheduling with Power-Time Tradeoff and Hot Spot Avoidance. DATE 2004: 710-711 |
| 2003 | ||
| 2 | EE | Mehrdad Nourani, James Chin: Power-Time Tradeoff in Test Scheduling for SoCs. ICCD 2003: 548-553 |
| 2002 | ||
| 1 | EE | Mehrdad Nourani, James Chin: Testing High-Speed SoCs Using Low-Speed ATEs. VTS 2002: 133-138 |
| 1 | Mehrdad Nourani | [1] [2] [3] [4] |