| |
| 2007 | ||
|---|---|---|
| 3 | EE | Hugo Cheung, Sandeep K. Gupta: Accurate modeling and fault simulation of Byzantine resistive bridges. ICCD 2007: 347-353 |
| 2000 | ||
| 2 | EE | Hugo Cheung, Sandeep K. Gupta: A Framework to Minimize Test Escape and Yield Loss during IDDQ Testing: A Case Study. VTS 2000: 89-96 |
| 1996 | ||
| 1 | Hugo Cheung, Sandeep K. Gupta: A BIST Methodology for Comprehensive Testing of RAM with Reduced Heat Dissipation. ITC 1996: 386-395 | |
| 1 | Sandeep K. Gupta | [1] [2] [3] |