2008 |
4 | EE | Simone Raoux,
Geoffrey W. Burr,
Matthew J. Breitwisch,
Charles T. Rettner,
Yi-Chou Chen,
Robert M. Shelby,
Martin Salinga,
Daniel Krebs,
Shih-Hung Chen,
Hsiang-Lan Lung,
Chung Hon Lam:
Phase-change random access memory: A scalable technology.
IBM Journal of Research and Development 52(4-5): 465-480 (2008) |
2006 |
3 | EE | Shih-Hung Chen,
Ming-Dou Ker:
Failure analysis and solutions to overcome latchup failure event of a power controller IC in bulk CMOS technology.
Microelectronics Reliability 46(7): 1042-1049 (2006) |
2005 |
2 | EE | Shih-Hung Chen,
Ming-Dou Ker:
Investigation on seal-ring rules for IC product reliability in 0.25-mum CMOS technology.
Microelectronics Reliability 45(9-11): 1311-1316 (2005) |
2001 |
1 | EE | Shin-Jye Liang,
Jiunn-Horng Lee,
Shih-Hung Chen,
Jr-Huang Shiau:
Networked Collaborative Environment for Hydro-Engineering.
International Journal of Computational Engineering Science 2(4): 557-568 (2001) |