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2006 | ||
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2 | EE | Yang-Hua Chang, Hui-Fen Hsu: Determination of thermal resistance using Gummel measurement for InGaP/GaAs HBTs. Microelectronics Reliability 46(12): 2074-2078 (2006) |
2003 | ||
1 | EE | Yang-Hua Chang, Chen-Chun Chang-Chiang, Yueh-Cheng Lee, Chi-Chung Liu: Design of multi-finger HBTs with a thermal-electrical model. Microelectronics Reliability 43(3): 421-426 (2003) |
1 | Chen-Chun Chang-Chiang | [1] |
2 | Hui-Fen Hsu | [2] |
3 | Yueh-Cheng Lee | [1] |
4 | Chi-Chung Liu | [1] |