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Hui-Fen Hsu

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2006
1EEYang-Hua Chang, Hui-Fen Hsu: Determination of thermal resistance using Gummel measurement for InGaP/GaAs HBTs. Microelectronics Reliability 46(12): 2074-2078 (2006)

Coauthor Index

1Yang-Hua Chang [1]

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