| 2006 |
|---|
| 3 | EE | P. C. Chang,
T. W. Liao:
Combining SOM and fuzzy rule base for flow time prediction in semiconductor manufacturing factory.
Appl. Soft Comput. 6(2): 198-206 (2006) |
| 2 | EE | Y. D. Jhou,
C. H. Chen,
S. J. Chang,
Y. K. Su,
P. C. Chang,
P. C. Chen,
H. Hung,
C. L. Yu,
S. M. Wang,
M. H. Wu:
GaN MSM photodetectors with photo-CVD annealed Ni/Au electrodes.
Microelectronics Journal 37(4): 328-331 (2006) |
| 2001 |
|---|
| 1 | EE | W. D. Zhuang,
P. C. Chang,
F. Y. Chou,
R. K. Shiue:
Effect of solder creep on the reliability of large area die attachment.
Microelectronics Reliability 41(12): 2011-2021 (2001) |
