| |
| 1996 | ||
|---|---|---|
| 1 | F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos, João Paulo Teixeira: Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. ITC 1996: 620-628 | |
| 1 | L. Dias | [1] |
| 2 | J. Ferreira | [1] |
| 3 | Marcelino B. Santos | [1] |
| 4 | João Paulo Teixeira | [1] |