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F. Celeiro

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1996
1 F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos, João Paulo Teixeira: Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. ITC 1996: 620-628

Coauthor Index

1L. Dias [1]
2J. Ferreira [1]
3Marcelino B. Santos [1]
4João Paulo Teixeira [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)