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2003 | ||
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2 | EE | F. Brunner, A. Braun, P. Kurpas, J. Schneider, J. Würfl, M. Weyers: Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE. Microelectronics Reliability 43(6): 839-844 (2003) |
1995 | ||
1 | Thomas Brinkhoff, Hans-Peter Kriegel, Ralf Schneider, A. Braun: Measuring the Complexity of Polygonal Objects. ACM-GIS 1995: 109- |
1 | Thomas Brinkhoff | [1] |
2 | F. Brunner | [2] |
3 | Hans-Peter Kriegel | [1] |
4 | P. Kurpas | [2] |
5 | J. Schneider | [2] |
6 | Ralf Schneider | [1] |
7 | M. Weyers | [2] |
8 | J. Würfl | [2] |