| |
| 2003 | ||
|---|---|---|
| 1 | EE | F. Brunner, A. Braun, P. Kurpas, J. Schneider, J. Würfl, M. Weyers: Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE. Microelectronics Reliability 43(6): 839-844 (2003) |
| 1 | A. Braun | [1] |
| 2 | F. Brunner | [1] |
| 3 | J. Schneider | [1] |
| 4 | M. Weyers | [1] |
| 5 | J. Würfl | [1] |