| |
| 2006 | ||
|---|---|---|
| 2 | EE | A. Emre Yarimbiyik, Harry A. Schafft, Richard A. Allen, Mona E. Zaghloul, David L. Blackburn: Modeling and simulation of resistivity of nanometer scale copper. Microelectronics Reliability 46(7): 1050-1057 (2006) |
| 2003 | ||
| 1 | EE | Yogendra Joshi, Kaveh Azar, David L. Blackburn, Clemens J. M. Lasance, Ravi Mahajan, Jukka Rantala: How well can we assess thermally driven reliability issues in electronic systems today? Summary of panel held at the Therminic 2002. Microelectronics Journal 34(12): 1195-1201 (2003) |
| 1 | Richard A. Allen | [2] |
| 2 | Kaveh Azar | [1] |
| 3 | Yogendra Joshi | [1] |
| 4 | Clemens J. M. Lasance | [1] |
| 5 | Ravi Mahajan | [1] |
| 6 | Jukka Rantala | [1] |
| 7 | Harry A. Schafft | [2] |
| 8 | A. Emre Yarimbiyik | [2] |
| 9 | Mona E. Zaghloul | [2] |