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| 2003 | ||
|---|---|---|
| 1 | EE | Yogendra Joshi, Kaveh Azar, David L. Blackburn, Clemens J. M. Lasance, Ravi Mahajan, Jukka Rantala: How well can we assess thermally driven reliability issues in electronic systems today? Summary of panel held at the Therminic 2002. Microelectronics Journal 34(12): 1195-1201 (2003) |
| 1 | Kaveh Azar | [1] |
| 2 | David L. Blackburn | [1] |
| 3 | Yogendra Joshi | [1] |
| 4 | Clemens J. M. Lasance | [1] |
| 5 | Jukka Rantala | [1] |