| |
| 2006 | ||
|---|---|---|
| 3 | Matthias Beyer, Winfried Dulz, Kai-Steffen Jens Hielscher: Performance issues in statistical testing. MMB 2006: 191-208 | |
| 2003 | ||
| 2 | EE | Matthias Beyer, Winfried Dulz, Fenhua Zhen: Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains. Asian Test Symposium 2003: 102-105 |
| 1 | EE | Matthias Beyer, Winfried Dulz: Scenario-Based Statistical Testing of Quality of Service Requirements. Scenarios: Models, Transformations and Tools 2003: 152-173 |
| 1 | Winfried Dulz | [1] [2] [3] |
| 2 | Kai-Steffen Jens Hielscher | [3] |
| 3 | Fenhua Zhen | [2] |