Fenhua Zhen

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2003

2 EE Matthias Beyer, Winfried Dulz, Fenhua Zhen: Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains. Asian Test Symposium 2003: 102-105

1 EE Winfried Dulz, Fenhua Zhen: MaTeLo - Statistical Usage Testing by Annotated Sequence Diagrams, Markov Chains and TTCN-3. QSIC 2003: 336-342

2003
2	EE	Matthias Beyer, Winfried Dulz, Fenhua Zhen: Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains. Asian Test Symposium 2003: 102-105
1	EE	Winfried Dulz, Fenhua Zhen: MaTeLo - Statistical Usage Testing by Annotated Sequence Diagrams, Markov Chains and TTCN-3. QSIC 2003: 336-342

Coauthor Index

1 Matthias Beyer [2]

2 Winfried Dulz [1] [2]