Vijay Bettada
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2003
1
EE
Joel Grodstein
,
Dilip K. Bhavsar
, Vijay Bettada,
Richard A. Davies
: Automatic Generation of Critical-Path Tests for a Partial-Scan Microprocessor.
ICCD 2003
: 180-186
Coauthor
Index
1
Dilip K. Bhavsar
[
1
]
2
Richard A. Davies
[
1
]
3
Joel Grodstein
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
