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2006 | ||
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2 | EE | L. Chen, O. J. Guy, D. Doneddu, S. G. J. Batcup, S. P. Wilks, P. A. Mawby, T. Bouchet, F. Torregrosa: Report on 4H-SiC JTE Schottky diodes. Microelectronics Reliability 46(2-4): 637-640 (2006) |
2002 | ||
1 | EE | P. M. Igic, P. A. Mawby, M. S. Towers, W. Jamal, S. G. J. Batcup: Investigation of the power dissipation during IGBT turn-off using a new physics-based IGBT compact model. Microelectronics Reliability 42(7): 1045-1052 (2002) |
1 | T. Bouchet | [2] |
2 | L. Chen | [2] |
3 | D. Doneddu | [2] |
4 | O. J. Guy | [2] |
5 | P. M. Igic | [1] |
6 | W. Jamal | [1] |
7 | P. A. Mawby | [1] [2] |
8 | F. Torregrosa | [2] |
9 | M. S. Towers | [1] |
10 | S. P. Wilks | [2] |