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| 2006 | ||
|---|---|---|
| 2 | EE | L. Chen, O. J. Guy, D. Doneddu, S. G. J. Batcup, S. P. Wilks, P. A. Mawby, T. Bouchet, F. Torregrosa: Report on 4H-SiC JTE Schottky diodes. Microelectronics Reliability 46(2-4): 637-640 (2006) |
| 2002 | ||
| 1 | EE | P. M. Igic, P. A. Mawby, M. S. Towers, W. Jamal, S. G. J. Batcup: Investigation of the power dissipation during IGBT turn-off using a new physics-based IGBT compact model. Microelectronics Reliability 42(7): 1045-1052 (2002) |
| 1 | T. Bouchet | [2] |
| 2 | L. Chen | [2] |
| 3 | D. Doneddu | [2] |
| 4 | O. J. Guy | [2] |
| 5 | P. M. Igic | [1] |
| 6 | W. Jamal | [1] |
| 7 | P. A. Mawby | [1] [2] |
| 8 | F. Torregrosa | [2] |
| 9 | M. S. Towers | [1] |
| 10 | S. P. Wilks | [2] |