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S. G. J. Batcup

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2006
2EEL. Chen, O. J. Guy, D. Doneddu, S. G. J. Batcup, S. P. Wilks, P. A. Mawby, T. Bouchet, F. Torregrosa: Report on 4H-SiC JTE Schottky diodes. Microelectronics Reliability 46(2-4): 637-640 (2006)
2002
1EEP. M. Igic, P. A. Mawby, M. S. Towers, W. Jamal, S. G. J. Batcup: Investigation of the power dissipation during IGBT turn-off using a new physics-based IGBT compact model. Microelectronics Reliability 42(7): 1045-1052 (2002)

Coauthor Index

1T. Bouchet [2]
2L. Chen [2]
3D. Doneddu [2]
4O. J. Guy [2]
5P. M. Igic [1]
6W. Jamal [1]
7P. A. Mawby [1] [2]
8F. Torregrosa [2]
9M. S. Towers [1]
10S. P. Wilks [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)