1998 | ||
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4 | EE | Christos A. Papachristou, Mikhail Baklashov, Kowen Lai: High-Level Test Synthesis for Behavioral and Structural Designs. J. Electronic Testing 13(2): 167-188 (1998) |
1997 | ||
3 | EE | Kowen Lai, Christos A. Papachristou, Mikhail Baklashov: BIST testability enhancement using high level test synthesis for behavioral and structural designs. Asian Test Symposium 1997: 338-342 |
2 | EE | Christos A. Papachristou, Mikhail Baklashov: A test synthesis technique using redundant register transfers. ICCAD 1997: 414-420 |
1 | Kowen Lai, Christos A. Papachristou, Mikhail Baklashov: High Level Test Synthesis Across the Boundary of Behavioral and Structural Domains. ICCD 1997: 636-641 |
1 | Kowen Lai | [1] [3] [4] |
2 | Christos A. Papachristou | [1] [2] [3] [4] |