| |
| 1998 | ||
|---|---|---|
| 4 | EE | Christos A. Papachristou, Mikhail Baklashov, Kowen Lai: High-Level Test Synthesis for Behavioral and Structural Designs. J. Electronic Testing 13(2): 167-188 (1998) |
| 1997 | ||
| 3 | EE | Kowen Lai, Christos A. Papachristou, Mikhail Baklashov: BIST testability enhancement using high level test synthesis for behavioral and structural designs. Asian Test Symposium 1997: 338-342 |
| 2 | Kowen Lai, Christos A. Papachristou, Mikhail Baklashov: High Level Test Synthesis Across the Boundary of Behavioral and Structural Domains. ICCD 1997: 636-641 | |
| 1996 | ||
| 1 | EE | Kowen Lai, Christos A. Papachristou: BIST Testability Enhancement of System Level Circuits : Experience with An Industrial Design. Asian Test Symposium 1996: 219- |
| 1 | Mikhail Baklashov | [2] [3] [4] |
| 2 | Christos A. Papachristou | [1] [2] [3] [4] |