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2004 | ||
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2 | EE | Kendrick Baker, Mehrdad Nourani: Interconnect Test Pattern Generation Algorithm For Meeting Device and Global SSO Limits With Safe Initial Vectors. ITC 2004: 163-172 |
2003 | ||
1 | EE | Kendrick Baker: Constructive Pattern Generation Heuristic for Meeting SSO Limits. ITC 2003: 368 |
1 | Mehrdad Nourani | [2] |