| |
| 2009 | ||
|---|---|---|
| 3 | EE | Charles Augustine, Arijit Raychowdhury, Yunfei Gao, Mark S. Lundstrom, Kaushik Roy: PETE: A device/circuit analysis framework for evaluation and comparison of charge based emerging devices. ISQED 2009: 80-85 |
| 2008 | ||
| 2 | EE | Jing Li, Charles Augustine, Sayeef S. Salahuddin, Kaushik Roy: Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array for yield enhancement. DAC 2008: 278-283 |
| 1 | EE | Nilanjan Banerjee, Charles Augustine, Kaushik Roy: Fault-Tolerance with Graceful Degradation in Quality: A Design Methodology and Its Application to Digital Signal Processing Systems. DFT 2008: 323-331 |
| 1 | Nilanjan Banerjee | [1] |
| 2 | Yunfei Gao | [3] |
| 3 | Jing Li | [2] |
| 4 | Mark S. Lundstrom | [3] |
| 5 | Arijit Raychowdhury | [3] |
| 6 | Kaushik Roy | [1] [2] [3] |
| 7 | Sayeef S. Salahuddin | [2] |