Hideyuki Aoki
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2000
1
EE
Makoto Ikeda
, Hideyuki Aoki,
Kunihiro Asada
: DVDT: Design for Voltage Drop Test Using Onchip-Voltage Scan Path.
ISQED 2000
: 305-308
Coauthor
Index
1
Kunihiro Asada
[
1
]
2
Makoto Ikeda
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
