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| 2007 | ||
|---|---|---|
| 1 | EE | Artur Wymyslowski, Bart Vandevelde, Dag Andersson: Thermal, mechanical and multi-physics simulation and experiments in micro-electronics and micro-systems. Microelectronics Reliability 47(2-3): 159-160 (2007) |
| 1 | Bart Vandevelde | [1] |
| 2 | Artur Wymyslowski | [1] |