James C. Andersen

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2000

1 Jerry J. Broz, James C. Andersen, Reynaldo M. Rincon: Reducing device yield fallout at wafer level test with electrohydrodynamic (EHD) cleaning. ITC 2000: 477-484

2000
1		Jerry J. Broz, James C. Andersen, Reynaldo M. Rincon: Reducing device yield fallout at wafer level test with electrohydrodynamic (EHD) cleaning. ITC 2000: 477-484

Coauthor Index

1 Jerry J. Broz [1]

2 Reynaldo M. Rincon [1]