Atlaf Ul Amin

List of publications from the DBLP Bibliography Server - FAQ

2002

1 EE Atlaf Ul Amin, Satoshi Ohtake, Hideo Fujiwara: Design for Two-Pattern Testability of Controller-Data Path Circuits. Asian Test Symposium 2002: 73-79

2002
1	EE	Atlaf Ul Amin, Satoshi Ohtake, Hideo Fujiwara: Design for Two-Pattern Testability of Controller-Data Path Circuits. Asian Test Symposium 2002: 73-79

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