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| 1995 | ||
|---|---|---|
| 2 | Hitesh Ahuja, Dean Arriens, Ben Schneller, Vandana Verma, Wendy Whitman: Intel 386TM EX Embedded Processor IDDQ Testing. ITC 1995: 902-909 | |
| 1994 | ||
| 1 | EE | Premachandran R. Menon, Hitesh Ahuja, Mohan Harihara: Redundancy identification and removal in combinational circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 13(5): 646-651 (1994) |
| 1 | Dean Arriens | [2] |
| 2 | Mohan Harihara | [1] |
| 3 | Premachandran R. Menon | [1] |
| 4 | Ben Schneller | [2] |
| 5 | Vandana Verma | [2] |
| 6 | Wendy Whitman | [2] |