2005 |
25 | EE | Keiko Takahashi,
Masaki Matsuura,
Takahiro Sugiyama,
Keiichi Abe:
A comparison of color coordinate systems using color classification and image segmentation results of humans.
Systems and Computers in Japan 36(10): 93-105 (2005) |
2003 |
24 | EE | Hirokazu Muramatsu,
Takashi Kobayashi,
Takahiro Sugiyama,
Keiichi Abe:
Improvement of Matching and Evaluation in Handwritten Numeral Recognition Using Flexible Standard Patterns.
ICDAR 2003: 273-277 |
2002 |
23 | | Yasutaka Etou,
Takahiro Sugiyama,
Keiichi Abe,
Toru Abe:
Corner detection using slit rotational edge-feature detector.
ICIP (2) 2002: 797-800 |
22 | EE | Kensuke Shiraki,
Masato Ishii,
Takahiro Sugiyama,
Keiichi Abe:
Quantitative Evaluation of Damaged Areas of a Big Earthquake Detected by Image Processing and GIS Information.
MVA 2002: 504-507 |
2001 |
21 | EE | Takashi Kobayashi,
Kaori Nakamura,
Hirokazu Muramatsu,
Takahiro Sugiyama,
Keiichi Abe:
Handwritten Numeral Recognition Using Flexible Matching Based on Learning of Stroke Statistics.
ICDAR 2001: 612-616 |
2000 |
20 | EE | Takahiro Sugiyama,
Keiichi Abe:
Edge Detection Method Based on Edge Reliability with Fixed Thresholds: Consideration of Uniformity and Gradation.
ICPR 2000: 3660-3663 |
19 | EE | Fumiaki Yamana,
Takahiro Sugiyama,
Keiichi Abe:
Edge Plane Detection in Spatio-Temporal Images by Using Edge Vector and Edge Reliability.
ICPR 2000: 3664-3667 |
18 | EE | Keiko Takahashi,
Masaki Matsuura,
Takahiro Sugiyama,
Keiichi Abe:
Comparison of Color Space Models Based on Human Color Classification and Image Segmentation.
MVA 2000: 39-43 |
17 | EE | Jin Jia,
Keiichi Abe:
Recognizing 3D Objects by Using Models Learned Automatically from 2D Training Images.
IJPRAI 14(3): 315-338 (2000) |
1998 |
16 | | Jin Jia,
Keiichi Abe:
Learning and Recognizing 3D Objects by Using Partial Planar Curve Matching Method.
ACCV (1) 1998: 450-457 |
15 | EE | Jin Jia,
Keiichi Abe:
Clustering of Learning Images and Generation of Multiple Prototypes for Object Recognition.
MVA 1998: 46-49 |
1997 |
14 | EE | Takahiro Sugiyama,
Keiichi Abe:
Edge feature analysis by a vectorized feature extractor for multiple edges.
Systems and Computers in Japan 28(10): 20-29 (1997) |
1996 |
13 | EE | Keiichi Abe,
Carlo Arcelli,
Takeshi Hisajama,
Toshio Ibaraki:
Parts of planar shapes.
Pattern Recognition 29(10): 1703-1711 (1996) |
1995 |
12 | | Tokuhisa Kadonaga,
Keiichi Abe:
Comparison of Methods for Detecting Corner Points from Digital Curves.
GREC 1995: 23-34 |
11 | EE | Caihua Wang,
Keiichi Abe:
Region Correspondence by Inexact Attributed Planar Graph Matching.
ICCV 1995: 440- |
1994 |
10 | EE | Takahiro Sugiyama,
Keiichi Abe:
Image Segmentation Using both Edge and Region Information.
MVA 1994: 127-130 |
9 | EE | Caihua Wang,
Keiichi Abe:
Region Correspondence for Color Scene Images Taken from Different Viewpoints.
MVA 1994: 26-29 |
8 | EE | Andreas Held,
Keiichi Abe:
On the decomposition of binary shapes into meaningful parts.
Pattern Recognition 27(5): 637-647 (1994) |
7 | EE | Andreas Held,
Keiichi Abe:
On approximate convexity.
Pattern Recognition Letters 15(6): 611-618 (1994) |
1992 |
6 | EE | Daisuke Yagi,
Keiichi Abe,
Hiromasa Nakatani:
Segmentation of Color Aerial Photographs Using HSV Color Models.
MVA 1992: 367-370 |
1990 |
5 | EE | Carlo Arcelli,
Andreas Held,
Keiichi Abe:
A Coarse to Fine Corner-Finding Method.
MVA 1990: 427-430 |
1987 |
4 | EE | Satoshi Suzuki,
Keiichi Abe:
Binary picture thinning by an iterative parallel two-subcycle operation.
Pattern Recognition 20(3): 297-307 (1987) |
1985 |
3 | EE | Satoshi Suzuki,
Keiichi Abe:
Topological structural analysis of digitized binary images by border following.
Computer Vision, Graphics, and Image Processing 30(1): 32-46 (1985) |
2 | EE | Moshe Kushnir,
Keiichi Abe,
Kinji Matsumoto:
Recognition of handprinted Hebrew characters using features selected in the Hough transform space.
Pattern Recognition 18(2): 103-114 (1985) |
1983 |
1 | EE | Moshe Kushnir,
Keiichi Abe,
Kinji Matsumoto:
An application of the hough transform to the recognition of printed hebrew characters.
Pattern Recognition 16(2): 183-191 (1983) |