| |
| 2007 | ||
|---|---|---|
| 2 | Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich: Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair. DDECS 2007: 185-190 | |
| 1 | EE | Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich: An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. European Test Symposium 2007: 91-96 |
| 1 | Sybille Hellebrand | [1] [2] |
| 2 | Hans-Joachim Wunderlich | [1] [2] |