2001 | ||
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1 | EE | Yuan Ji, Ziguo Li, Dong Wang, Yaohai Cheng, Dong Luo, Bin Zong: Scanning thermal microscopy studies of local temperature distribution of micron-sized metallization lines. Microelectronics Reliability 41(8): 1255-1258 (2001) |
1 | Yaohai Cheng | [1] |
2 | Yuan Ji | [1] |
3 | Ziguo Li | [1] |
4 | Dong Luo | [1] |
5 | Dong Wang | [1] |