| |
| 2001 | ||
|---|---|---|
| 1 | EE | Yuan Ji, Ziguo Li, Dong Wang, Yaohai Cheng, Dong Luo, Bin Zong: Scanning thermal microscopy studies of local temperature distribution of micron-sized metallization lines. Microelectronics Reliability 41(8): 1255-1258 (2001) |
| 1 | Yuan Ji | [1] |
| 2 | Ziguo Li | [1] |
| 3 | Dong Luo | [1] |
| 4 | Dong Wang | [1] |
| 5 | Bin Zong | [1] |