Y. L. Zhang

2006
3	EE	Y. L. Zhang, G. J. Wang, Z. C. Ji: Replacement problems for a cold standby repairable system. Int. J. Systems Science 37(1): 17-25 (2006)
2	EE	Y. L. Zhang, D. X. Q. Shi, W. Zhou: Reliability study of underfill/chip interface under accelerated temperature cycling (ATC) loading. Microelectronics Reliability 46(2-4): 409-420 (2006)
2005
1	EE	G. J. Wang, Y. L. Zhang: A shock model with two-type failures and optimal replacement policy. Int. J. Systems Science 36(4): 209-214 (2005)

Coauthor Index

1	Z. C. Ji	[3]
2	D. X. Q. Shi	[2]
3	G. J. Wang	[1] [3]
4	W. Zhou	[2]

Colors in the list of coauthors