D. X. Q. Shi

List of publications from the DBLP Bibliography Server - FAQ

2006

1 EE Y. L. Zhang, D. X. Q. Shi, W. Zhou: Reliability study of underfill/chip interface under accelerated temperature cycling (ATC) loading. Microelectronics Reliability 46(2-4): 409-420 (2006)

2006
1	EE	Y. L. Zhang, D. X. Q. Shi, W. Zhou: Reliability study of underfill/chip interface under accelerated temperature cycling (ATC) loading. Microelectronics Reliability 46(2-4): 409-420 (2006)

Coauthor Index