2003 | ||
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1 | EE | Y. S. Roh, A. Asiz, W. P. Zhang, Y. Xi: Experimental study and theoretical prediction of aging induced frequency shift of crystal resonators and oscillators. Microelectronics Reliability 43(12): 1993-2000 (2003) |
1 | A. Asiz | [1] |
2 | Y. S. Roh | [1] |
3 | Y. Xi | [1] |