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| 2003 | ||
|---|---|---|
| 1 | EE | Y. S. Roh, A. Asiz, W. P. Zhang, Y. Xi: Experimental study and theoretical prediction of aging induced frequency shift of crystal resonators and oscillators. Microelectronics Reliability 43(12): 1993-2000 (2003) |
| 1 | Y. S. Roh | [1] |
| 2 | Y. Xi | [1] |
| 3 | W. P. Zhang | [1] |