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| 2004 | ||
|---|---|---|
| 1 | EE | Songqing Zhang, Vineet Wason, Kaustav Banerjee: A probabilistic framework to estimate full-chips subthreshold leakage power distribution considering within-die and die-to-die P-T-V variations. ISLPED 2004: 156-161 |
| 1 | Kaustav Banerjee | [1] |
| 2 | Vineet Wason | [1] |