| |
| 2004 | ||
|---|---|---|
| 2 | EE | Xiangbin Zeng, X. W. Sun, Junfeng Li, Johnny K. O. Sin: Improving reliability of poly-Si TFTs with channel layer and gate oxide passivated by NH3/N2O plasma. Microelectronics Reliability 44(3): 435-442 (2004) |
| 2003 | ||
| 1 | EE | Xiangbin Zeng, X. W. Sun, Johnny K. O. Sin: Improving hydrogenation efficiency of polycrystalline silicon thin film transistors by a new approach. Microelectronics Journal 34(11): 1079-1085 (2003) |
| 1 | Junfeng Li | [2] |
| 2 | Johnny K. O. Sin | [1] [2] |
| 3 | X. W. Sun | [1] [2] |