Johnny K. O. Sin

List of publications from the DBLP Bibliography Server - FAQ

2004

2 EE Xiangbin Zeng, X. W. Sun, Junfeng Li, Johnny K. O. Sin: Improving reliability of poly-Si TFTs with channel layer and gate oxide passivated by NH₃/N₂O plasma. Microelectronics Reliability 44(3): 435-442 (2004)

2003

1 EE Xiangbin Zeng, X. W. Sun, Johnny K. O. Sin: Improving hydrogenation efficiency of polycrystalline silicon thin film transistors by a new approach. Microelectronics Journal 34(11): 1079-1085 (2003)

2004
2	EE	Xiangbin Zeng, X. W. Sun, Junfeng Li, Johnny K. O. Sin: Improving reliability of poly-Si TFTs with channel layer and gate oxide passivated by NH₃/N₂O plasma. Microelectronics Reliability 44(3): 435-442 (2004)
2003
1	EE	Xiangbin Zeng, X. W. Sun, Johnny K. O. Sin: Improving hydrogenation efficiency of polycrystalline silicon thin film transistors by a new approach. Microelectronics Journal 34(11): 1079-1085 (2003)

Coauthor Index