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2003 | ||
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2 | EE | Alexandrine Guédon, Eric Woirgard, Christian Zardini, Guillaume Simon: Methodology to evaluate the correspondence between real conditions and accelerated tests of a thyristor system used in a power plant. Microelectronics Reliability 43(9-11): 1853-1858 (2003) |
2002 | ||
1 | EE | Alexandrine Guédon, Eric Woirgard, Christian Zardini: Evaluation of lead-free soldering for automotive applications. Microelectronics Reliability 42(9-11): 1555-1558 (2002) |
1 | Alexandrine Guédon | [1] [2] |
2 | Guillaume Simon | [2] |
3 | Eric Woirgard | [1] [2] |