J.-W. Zahlmann-Nowitzki

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2001

1 EE J.-W. Zahlmann-Nowitzki, L. Nebrich, P. Seegebrecht: On the influence of the variation of measurement conditions on the FNT characteristics of stressed thin silicon oxides. Microelectronics Reliability 41(7): 1067-1069 (2001)

2001
1	EE	J.-W. Zahlmann-Nowitzki, L. Nebrich, P. Seegebrecht: On the influence of the variation of measurement conditions on the FNT characteristics of stressed thin silicon oxides. Microelectronics Reliability 41(7): 1067-1069 (2001)

Coauthor Index

1 L. Nebrich [1]

2 P. Seegebrecht [1]