S. Zafar
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2006
1
EE
James H. Stathis
, S. Zafar: The negative bias temperature instability in MOS devices: A review.
Microelectronics Reliability 46
(2-4): 270-286 (2006)
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Index
1
James H. Stathis
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
