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Lu Yunguang

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2002
1EEHuimin Xie, Anand Asundi, Chai Gin Boay, Lu Yunguang, Jin Yu, Zhaowei Zhong, Bryan K. A. Ngoi: High resolution AFM scanning Moiré method and its application to the micro-deformation in the BGA electronic package. Microelectronics Reliability 42(8): 1219-1227 (2002)

Coauthor Index

1Anand Asundi [1]
2Chai Gin Boay [1]
3Bryan K. A. Ngoi [1]
4Huimin Xie [1]
5Jin Yu [1]
6Zhaowei Zhong [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)