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2002 | ||
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1 | EE | Huimin Xie, Anand Asundi, Chai Gin Boay, Lu Yunguang, Jin Yu, Zhaowei Zhong, Bryan K. A. Ngoi: High resolution AFM scanning Moiré method and its application to the micro-deformation in the BGA electronic package. Microelectronics Reliability 42(8): 1219-1227 (2002) |
1 | Anand Asundi | [1] |
2 | Chai Gin Boay | [1] |
3 | Bryan K. A. Ngoi | [1] |
4 | Huimin Xie | [1] |
5 | Jin Yu | [1] |
6 | Zhaowei Zhong | [1] |