| |
| 2002 | ||
|---|---|---|
| 1 | EE | Huimin Xie, Anand Asundi, Chai Gin Boay, Lu Yunguang, Jin Yu, Zhaowei Zhong, Bryan K. A. Ngoi: High resolution AFM scanning Moiré method and its application to the micro-deformation in the BGA electronic package. Microelectronics Reliability 42(8): 1219-1227 (2002) |
| 1 | Anand Asundi | [1] |
| 2 | Bryan K. A. Ngoi | [1] |
| 3 | Huimin Xie | [1] |
| 4 | Jin Yu | [1] |
| 5 | Lu Yunguang | [1] |
| 6 | Zhaowei Zhong | [1] |