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Joel T. Yuen

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1994
4EEChien-In Henry Chen, Joel T. Yuen: Automated synthesis of pseudo-exhaustive test generator in VLSI BIST design. IEEE Trans. VLSI Syst. 2(3): 273-291 (1994)
1993
3EEChien-In Henry Chen, Joel T. Yuen: Logic partitioning to pseudo-exhaustive test for BIST design. ICCAD 1993: 646-649
1992
2 Chien-In Henry Chen, Joel T. Yuen: Concurrent Test Scheduling in Built-In Self-Test Environment. ICCD 1992: 256-259
1 Chien-In Henry Chen, Joel T. Yuen, Ji-Der Lee: Autonomous-Tol for Hardware Partitioning in a Built-in Self-Test Environment. ICCD 1992: 264-267

Coauthor Index

1Chien-In Henry Chen [1] [2] [3] [4]
2Ji-Der Lee [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)